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THS789PFD 데이터시트(PDF) 7 Page - Texas Instruments

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부품명 THS789PFD
상세설명  THS789 Quad-Channel Time Measurement Unit (TMU)
PDF  34 Pages
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제조업체  TI1 [Texas Instruments]
홈페이지  http://www.ti.com
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THS789PFD 데이터시트(HTML) 7 Page - Texas Instruments

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Sync to Event Delay (ns)
THS789
www.ti.com
SLOS776A – SEPTEMBER 2012 – REVISED DECEMBER 2015
6.6 Host Serial Interface DC Characteristics
over operating junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIH
High-level input voltage
0.7 × VCC
VCC + 0.5
V
VIL
Low-level input voltage
GND – 0.3
0.3 × VCC
V
VOH
High-level output voltage
VCC – 0.5
VCC + 0.3
V
VOL
Low-level output voltage
0
0.4
V
Ilkg
Leakage current
1
µA
6.7 Host Serial Interface AC Characteristics
over operating junction temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
HCLK frequency
50
MHz
Rise and fall times
3.5
ns
HCLK duty cycle
40%
50%
60%
Hstrobe high period between two consecutive transactions
40
ns
Hstrobe low to HCLK high setup
5
ns
HCLK high to Hstrobe high hold time
5
ns
Hdata in to HCLK high setup
5
ns
Hdata in to HCLK high hold time
5
ns
HCLK falling edge to Hdata out (L or H)
CL = 20 pF
3.25
ns
HCLK falling edge to Hdata out (H or L)
CL = 20 pF
3.25
ns
6.8 Power Consumption
Typical conditions are at 55°C junction temperature, VCC = 3.3 V.
CONDITION
TYP
MAX
UNIT
Four channel current
925
1236
mA
6.9 Typical Characteristics
Figure 1. Typical Per Channel Sigmas vs 5-ns (200-MHz) Window
Copyright © 2012–2015, Texas Instruments Incorporated
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