| 전자부품 데이터시트 검색엔진 |
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DS34C87TM 데이터시트(PDF) 4 Page - National Semiconductor (TI) |
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DS34C87TM 데이터시트(HTML) 4 Page - National Semiconductor (TI) |
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4 / 8 page ![]() AC Test Circuit and Switching Time Waveforms DS008576-3 Note: C1 = C2 = C3 = 40 pF (including Probe and Jig Capacitance), R1 = R2 = 50 Ω,R3 = 500Ω FIGURE 1. AC Test Circuit DS008576-4 FIGURE 2. Propagation Delays DS008576-5 FIGURE 3. Enable and Disable Times DS008576-7 Input pulse; f = 1 MHz, 50%,tr ≤ 6 ns, tf ≤ 6ns FIGURE 4. Differential Rise and Fall Times DS008576-8 FIGURE 5. Propagation Delays Test Circuit for “LS-Type” Load DS008576-6 FIGURE 6. Differential Rise and Fall Times Test Circuit for “LS-Type” Load DS008576-9 FIGURE 7. Load Enable and Disable Times Test Circuit for “LS-Type” Load www.national.com 4 |
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