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VSC8162 데이터시트(PDF) 13 Page - Vitesse Semiconductor Corporation

부품명 VSC8162
상세설명  2.488 Gbit/sec SONET/SDH 1:16 Demux with Clock Recovery
PDF  20 Pages
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제조업체  VITESSE [Vitesse Semiconductor Corporation]
홈페이지  http://www.vitesse.com
Logo VITESSE - Vitesse Semiconductor Corporation

VSC8162 데이터시트(HTML) 13 Page - Vitesse Semiconductor Corporation

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© VITESSE SEMICONDUCTOR CORPORATION
Page 13
9/14/98
741 Calle Plano, Camarillo, CA 93012 • 805/388-3700 • FAX: 805/987-5896
VITESSE
SEMICONDUCTOR CORPORATION
Advance Product Information
VSC8162
2.488 Gbit/sec SONET/SDH
1:16 Demux with Clock Recovery
G52209-0, Rev. 2.0
Absolute Maximum Ratings1
Power Supply Voltage, (VEE) .................................................................................................. -7V to VCC+0.5V
Power Supply Voltage, (VTT) ............................................................................................................ -3V to 0.5V
DC Input Voltage (Differential inputs) ......................................................................................... -2.5V to +0.5V
Output Current (Differential Outputs) ....................................................................................................+/-50mA
Case Temperature Under Bias ......................................................................................................-55o to +125oC
Storage Temperature.................................................................................................................. -65oC to +150oC
Recommended Operating Conditions
Power Supply Voltage, (VEE) ...............................................................................................................-5.2V+5%
Power Supply Voltage, (VTT) ...............................................................................................................-2.0V+5%
Operating Temperature Range ...........................................................0oC Ambient to +85oC Case Temperature
Notes:
(1) CAUTION: Stresses listed under “Absolute Maximum Ratings” may be applied to devices one at a time without causing per-
manent damage. Functionality at or above the values listed is not implied. Exposure to these values for extended periods may
affect device reliability.



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