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LM2408 데이터시트(PDF) 2 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
부품명 LM2408
상세설명  Monolithic Triple 4.5 ns CRT Driver
PDF  8 Pages
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제조업체  NSC [National Semiconductor (TI)]
홈페이지  http://www.national.com
Logo NSC - National Semiconductor (TI)

LM2408 데이터시트(HTML) 2 Page - National Semiconductor (TI)

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Absolute Maximum Ratings
(Notes 1 and 3)
Supply Voltage (VCC)
a
95V
Bias Voltage (VBB)
a
16V
Input Voltage (VIN)
b
05V to VBIAS a 05V
Storage Temperature Range (TSTG)
b
65 Cto a150 C
Lead Temperature (Soldering k10 sec)
300 C
ESD Tolerance
2 kV
Operating Ranges (Note 2)
VCC
a
60V to a85V
VBB
a
8V to a15V
VIN
a
1V to a7V
Case Temperature (TCASE)
b
20 Cto a100 C
Do not operate the part without a heat sink
Electrical Characteristics
Unless otherwise noted VCC ea80V VBB ea12V VIN ea32V (at LM2408 input pins) CL e 8 pF Output e 40 VPP at
1 MHz TA e 25 C
Symbol
Parameter
Conditions
LM2408
Units
Min
Typical
Max
ICC
Supply Current
Per Channel No Output Load
22
30
mA
IBB
Bias Current
21
mA
VOUT
DC Output Voltage
No Input Signal
47
50
53
VDC
AV
DC Voltage Gain
No Input Signal
b
13
b
15
b
17
D
AV
Gain Matching
(Note 4)
10
dB
LE
Linearity Error
(Notes 4 5)
8
%
tR
Rise Time
10% to 90% f e 1 MHz
45
ns
tF
Fall Time
90% to 10% f e 1 MHz
45
ns
Note 1
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur
Note 2
Operating ratings indicate conditions for which the device is functional but do not guarantee specific performance limits For guaranteed specifications and
test conditions see the Electrical Characteristics The guaranteed specifications apply only for the test conditions listed Some performance characteristics may
change when the device is not operated under the listed test conditions
Note 3
All voltages are measured with respect to GND unless otherwise specified
Note 4
Calculated value from Voltage Gain test on each channel
Note 5
Linearity Error is defined as the variation in DC gain from VIN ea 190V to VIN ea450V
Note 6
Input from signal generator tR tF k 1 ns
AC Test Circuit
TLH12683 – 3
Note
8 pF is total load plus parasitic capacitance
Note
Adjust Vtest for a32V DC at LM2408 input pins
FIGURE 2 Test Circuit (One Channel)
Figure 2 shows a typical test circuit for evaluation of the
LM2408 This circuit is designed to allow testing of the
LM2408 in a 50X environment such as a pulse generator
oscilloscope or network analyzer The 4950X resistor at the
output forms a 1001 voltage divider when connected to a
50X load
http
www nationalcom
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