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DS2155 데이터시트(PDF) 30 Page - Dallas Semiconductor

부품명 DS2155
상세설명  T1/E1/J1 Single-Chip Transceiver TDM/UTOPIA II Interface
PDF  262 Pages
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제조업체  DALLAS [Dallas Semiconductor]
홈페이지  https://www.maximintegrated.com/en.html
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DS2155 데이터시트(HTML) 30 Page - Dallas Semiconductor

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3.6
JTAG Test Access Port Pins
Signal Name:
JTRST
Signal Description:
IEEE 1149.1 Test Reset
Signal Type:
Input
JTRST is used to asynchronously reset the test access port controller. After power-up, JTRST must be toggled from
low to high. This action sets the device into the JTAG DEVICE ID mode. Normal device operation is restored by
pulling JTRST low. JTRST is pulled high internally by a 10kΩ resistor operation.
Signal Name:
JTMS
Signal Description:
IEEE 1149.1 Test Mode Select
Signal Type:
Input
This pin is sampled on the rising edge of JTCLK and is used to place the test access port into the various defined
IEEE 1149.1 states. This pin has a 10kΩ pullup resistor.
Signal Name:
JTCLK
Signal Description:
IEEE 1149.1 Test Clock Signal
Signal Type:
Input
This signal is used to shift data into JTDI on the rising edge and out of JTDO on the falling edge.
Signal Name:
JTDI
Signal Description:
IEEE 1149.1 Test Data Input
Signal Type:
Input
Test instructions and data are clocked into this pin on the rising edge of JTCLK. This pin has a 10kΩ pullup
resistor.
Signal Name:
JTDO
Signal Description:
IEEE 1149.1 Test Data Output
Signal Type:
Output
Test instructions and data are clocked out of this pin on the falling edge of JTCLK. If not used, this pin should be
left unconnected.



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