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STM32L475RG 데이터시트(PDF) 124 Page - STMicroelectronics

부품명 STM32L475RG
상세설명  Ultra-low-power ARM Cortex-M4 32-bit MCUFPU, 100DMIPS, up to 1MB Flash, 128 KB SRAM, USB OTG FS, analog, audio
PDF  193 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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STM32L475RG 데이터시트(HTML) 124 Page - STMicroelectronics

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Electrical characteristics
STM32L475xx
124/193
DocID027692 Rev 2
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application is
executed (toggling 2 LEDs through the I/O ports). This emission test is compliant with
IEC 61967-2 standard which specifies the test board and the pin loading.
6.3.12
Electrical sensitivity characteristics
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the ANSI/JEDEC standard.
Table 55. EMI characteristics
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fHCLK]
Unit
Max vs.
[fHSE = 8 MHz /
fHCLK = 80 MHz]
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C,
LQFP100 package
compliant with
IEC 61967-2
0.1 MHz to 30 MHz
-2
dBµV
30 MHz to 130 MHz
-9
130 MHz to 1 GHz
6
EMI Level
3.5
-
Table 56. ESD absolute maximum ratings
Symbol
Ratings
Conditions
Class
Maximum
value(1)
1. Guaranteed by characterization results.
Unit
VESD(HBM)
Electrostatic discharge
voltage (human body model)
TA = +25 °C, conforming
to ANSI/ESDA/JEDEC
JS-001
2
2000
V
VESD(CDM)
Electrostatic discharge
voltage (charge device
model)
TA = +25 °C,
conforming to ANSI/ESD
STM5.3.1
C3
250



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