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TSB611 데이터시트(PDF) 17 Page - STMicroelectronics

부품명 TSB611
상세설명  Low-power, rail-to-rail output, 36 V operational amplifier
PDF  24 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
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TSB611 데이터시트(HTML) 17 Page - STMicroelectronics

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TSB611
Application information
DocID028074 Rev 1
17/24
Equation 2
Where:
AFV is the voltage acceleration factor
β is the voltage acceleration constant in 1/V, constant technology parameter (β = 1)
VS is the stress voltage used for the accelerated test
VU is the voltage used for the application
The temperature acceleration is driven by the Arrhenius model, and is defined in
Equation 3.
Equation 3
Where:
AFT is the temperature acceleration factor
Ea is the activation energy of the technology based on the failure rate
k is the Boltzmann constant (8.6173 x 10
-5 eV.K-1)
TU is the temperature of the die when VU is used (K)
TS is the temperature of the die under temperature stress (K)
The final acceleration factor, AF, is the multiplication of the voltage acceleration factor and
the temperature acceleration factor (Equation 4).
Equation 4
AF is calculated using the temperature and voltage defined in the mission profile of the
product. The AF value can then be used in Equation 5 to calculate the number of months of
use equivalent to 1000 hours of reliable stress duration.
Equation 5
To evaluate the op amp reliability, a follower stress condition is used where VCC is defined
as a function of the maximum operating voltage and the absolute maximum rating
(as recommended by JEDEC rules).
The Vio drift (in µV) of the product after 1000 h of stress is tracked with parameters at
different measurement conditions (see Equation 6).
Equation 6
A
FV
e
β V
S
V
U
–
.
=
A
FT
e
E
a
k
------
1
T
U
1
T
S
–
=
.
A
F
A
FT
A
FV
×
=
Months
A
F
1000 h
×
12 months
24 h
365.25 days
×
×
=
/
V
CC
maxV
op with Vicm
V
CC
2
=
=



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