MCP6V74 datasheet(6/46 Pages) MICROCHIP

6 / 46 page

MCP6V71/1U/2/4

DS20005385B-page 6

 2015 Microchip Technology Inc.

1.3

Timing Diagrams

FIGURE 1-1:

Amplifier Start Up.

FIGURE 1-2:

Offset Correction Settling

Time.

FIGURE 1-3:

Output Overdrive Recovery.

1.4

Test Circuits

The circuits used for most DC and AC tests are shown

in Figures 1-4 and 1-5. Lay out the bypass capacitors

as discussed in Section 4.3.10 “Supply Bypassing

and Filtering”

. RN is equal to the parallel combination

of RF and RG to minimize bias current effects.

FIGURE 1-4:

AC and DC Test Circuit for

Most Noninverting Gain Conditions.

FIGURE 1-5:

AC and DC Test Circuit for

Most Inverting Gain Conditions.

The circuit in Figure 1-6 tests the input’s dynamic

behavior (i.e., IMD, tSTR, tSTL and tODR). The

potentiometer balances the resistor network (VOUT

should equal VREF at DC). The op amp’s Common

mode input voltage is VCM =VIN/2. The error at the

input (VERR) appears at VOUT with a noise gain of

10 V/V.

FIGURE 1-6:

Test Circuit for Dynamic

Input Behavior.

VDD

VOUT

1.001(VDD/3)

0.999(VDD/3)

tSTR

2V to 5.5V

VIN

VOS

VOS +100 µV

VOS –100 µV

tSTL

VIN

VOUT

VDD

VSS

tODR

VDD/2

VDD

VOUT

VIN

VDD/3

1µF

100 nF

RISO

MCP6V7X

VDD

VOUT

VDD/3

VIN

1µF

100 nF

RISO

MCP6V7X

VDD

VOUT

1µF

RISO

11.0 kΩ

249Ω

11.0 kΩ

500Ω

VIN

VREF =VDD/3

0.1%

25 turn

100 kΩ

0.1%

0 Ω

30 pF

open

100 nF

MCP6V7X

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