| 전자부품 데이터시트 검색엔진 |
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LM2425 데이터시트(PDF) 3 Page - National Semiconductor (TI) |
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LM2425 데이터시트(HTML) 3 Page - National Semiconductor (TI) |
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3 / 11 page ![]() AC Test Circuit Figure 3 shows a typical test circuit for evaluation of the LM2425. This circuit is designed to allow testing of the LM2425 in a 50 Ω environment without the use of an expensive FET probe. The two 4990 Ω resistors form a 400:1 divider with the 50Ω resistor and the oscilloscope. A test point is included for easy use of an oscilloscope probe. The compensation capacitor is used to compensate the network to achieve a flat frequency response. 20124103 Note: 10 pF load includes parasitic capacitance. FIGURE 3. Test Circuit (One Channel) www.national.com 3 |
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