| 전자부품 데이터시트 검색엔진 |
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ADG821 데이터시트(PDF) 8 Page - Analog Devices |
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ADG821 데이터시트(HTML) 8 Page - Analog Devices |
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8 / 12 page ![]() REV. 0 –8– ADG821/ADG822/ADG823 Test Circuits IDS V1 SD VS RON = V1/IDS Test Circuit 1. On Resistance SD VS A A VD IS (OFF) ID (OFF) Test Circuit 2. Off Leakage SD A VD ID (ON) NC NC = NO CONNECT Test Circuit 3. On Leakage VDD VDD 0.1 F VS IN SD GND RL 50 CL 35pF VOUT VIN VIN VOUT tON tOFF 50% 50% 90% 90% 50% 50% ADG821 ADG822 Test Circuit 4. Switching Times 0.1 F VDD VDD S1 D1 IN1, IN2 VS1 GND RL1 50 CL1 35pF VOUT1 VS2 VOUT2 RL2 50 CL2 35pF S2 VIN D2 tBBM tBBM 50% 50% 90% VIN VOUT1 VOUT2 90% 90% 90% 0V 0V 0V Test Circuit 5. Break-Before-Make Time Delay, tBBM (ADG823 only) VDD VDD SD IN VS GND CL 1nF VOUT RS SW ON VIN VOUT QINJ = CL ∆VOUT SW OFF VOUT Test Circuit 6. Charge Injection |
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