| 전자부품 데이터시트 검색엔진 |
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DS21352L 데이터시트(PDF) 98 Page - Dallas Semiconductor |
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DS21352L 데이터시트(HTML) 98 Page - Dallas Semiconductor |
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98 / 137 page ![]() DS21352/DS21552 98 of 137 The DS21352/552 are enhanced versions of the DS2152 and are backward pin-compatible. The JTAG feature uses pins that had no function in the DS2152. When using the JTAG feature, be sure FMS (pin 76) is tied LOW enabling the newly defined pins of the DS21352/552. Details on Boundary Scan Architecture and the Test Access Port can be found in IEEE 1149.1-1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994. The Test Access Port has the necessary interface pins; JTRST, JTCLK, JTMS, JTDI, and JTDO. See the pin descriptions for details. Figure 19-1 JTAG FUNCTIONAL BLOCK DIAGRAM +V Boundary Scan Register Identification Register Bypass Register Instruction Register JTDI JTMS JTCLK JTRST JTDO +V +V Test Access Port Controller MUX 10K 10K 10K Select Output Enable |
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