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AM29F016-120SIB 데이터시트(PDF) 34 Page - Advanced Micro Devices |
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AM29F016-120SIB 데이터시트(HTML) 34 Page - Advanced Micro Devices |
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34 / 36 page ![]() 34 Am29F016 ERASE AND PROGRAMMING PERFORMANCE Notes: 1. 25 °C, 5 V V CC, 100,000 cycles. 2. Although Embedded Algorithms allow for a longer chip program and erase time, the actual time will be considerably less since bytes program or erase significantly faster than the worst case byte. 3. Under worst case condition of 90 °C, 4.5 V V CC, 100,000 cycles. LATCHUP CHARACTERISTIC Includes all pins except VCC. Test conditions: VCC = 5.0 Volt, one pin at a time. TSOP PIN CAPACITANCE Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. Parameter Limits Unit Comments Min Typ Max Sector Erase Time 1 (Note 1) 8 sec Excludes 00H programming prior to erasure Chip Erase Time 32 256 sec Excludes 00H programming prior to erasure Byte Programming Time 7 300 (Note 3) µs Excludes system-level overhead Chip Programming Time 14.4 (Note 1) 43.2 (Notes 2, 3) sec Excludes system-level overhead Min Max Input Voltage with respect to VSS on I/O pins –1.0 V VCC + 1.0 V VCC Current –100 mA +100 mA Parameter Symbol Parameter Description Test Conditions Min Max Unit CIN Input Capacitance VIN = 0 6 7.5 pF COUT Output Capacitance VOUT = 0 8.5 12 pF CIN2 Control Pin Capacitance VIN = 0 7.5 9 pF |
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