| 전자부품 데이터시트 검색엔진 |
|
4356-RX-434 데이터시트(PDF) 8 Page - Silicon Laboratories |
|
|
|||||||||||||||||||||||||||||
4356-RX-434 데이터시트(HTML) 8 Page - Silicon Laboratories |
|
8 / 26 page ![]() Si4356 8 Rev 1.2 1.1. Definition of Test Conditions Production Test Conditions: TA =+25 °C VDD =+3.3VDC External reference signal (XIN) = 1.0 VPP at 30 MHz, centered around 0.8 VDC Production test schematic (unless noted otherwise) All RF input levels referred to the pins of the Si4356 (not the RF module) Qualification Test Conditions: TA = –40 to +85 °C (typical = 25 °C) VDD = +1.8 to +3.6 VDC (typical = 3.3 VDC) Using reference design or production test schematic All RF input levels are referred to the antenna port of Si4356 reference design or to the pins of the Si4356 when the production test setup is used. |
|
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |