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ST1S15 데이터시트(PDF) 9 Page - STMicroelectronics |
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ST1S15 데이터시트(HTML) 9 Page - STMicroelectronics |
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9 / 27 page ![]() ST1S15 Electrical characteristics DocID023280 Rev 4 9/27 Symbol Parameter Test conditions Min. Typ. Max. Unit VIN_TR Line transient response. Output voltage variation over the nominal DC level tR = tF = 10 µs case 1: VIN = 2.5 to 3.1 V case 2: VIN = 3.9 to 4.5 V IOUT = 50 mA, VOUT = 1.82 V ±50 mV IOUT = 250 mA, VOUT = 1.82 V IOUT_TR Load transient response tR= tF= 0.1 µs case 1: VIN = 2.5 V case 2: VIN = 3.6 V case 3: VIN = 4.5 V IOUT = 0 to 150 mA, VOUT = 1.82 V ±50 mV IOUT = 50 to 250 mA, VOUT = 1.82 V ±70 IOUT = 150 to 400 mA, VOUT = 1.82 V ±70 Logic inputs VIL Low-level input voltage (EN, MODE pins) 0.4 V VIH High-level input voltage (EN, MODE pins) 1.2 V ILK-I Input leakage current (EN, MODE pins) VEN = VMODE = 5.5 V 0.01 1 µA Power switches RDS(on) P-channel MOSFET on-resistance 300 400 mΩ N-channel MOSFET on-resistance 350 450 ILPEAK P-channel peak current limit Over the input voltage range 900 1000 1200 mA ILKG-P P-channel leakage current VIN = 5.5 V, VEN= 0 1 µA ILKG-N N-channel leakage current VSW = 5.5 V, VEN= 0 1 µA Notes: (1) Not tested in production. This value is guaranteed by correlation with RDS(on), peak current limit and operating input voltage. (2) Not tested in production. This parameter is guaranteed by peak current limit. |
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