Order Number

Description

SCANPSC110FFMQB

Military Flatpak

SCANPSC110FDMQB

Military DIP

SCANPSC110FLMQB

Military Leadless Chip Carrier

Pin

Names

Description

TCK

B

Backplane Test Clock Input

TMS

B

Backplane Test Mode Select Input

TDI

B

Backplane Test Data Input

TDO

B

Backplane Test Data Output

TRST

Asynchronous Test Reset Input (Active low)

S

(0,5)

Address Select Port

OE

Local Scan Port Output Enable (Active low)

TCK

L(1–3)

Local Port Test Clock Output

TMS

L(1–3)

Local Port Test Mode Select Output

TDI

L(1–3)

Local Port Test Data Input

TDO

L(1–3)

Local Port Test Data Output

Table of Contents

1.

GLOSSARY OF TERMS:

2

2.

DETAILED PIN DESCRIPTION TABLE:

3

3.

OVERVIEW OF SCAN BRIDGE FUNCTIONS:

4

A. SCANPSC110F Bridge Architecture:

4

B. SCANPSC110F Bridge State Machines:

4

4.

TESTER/SCANPSC110F BRIDGE INTERFACE:

8

5.

REGISTER SET:

8

6.

ADDRESSING SCHEME:

8

7.

HIERARCHICAL TEST SUPPORT:

9

8.

LEVEL 1 PROTOCOL:

9

A. Addressing Modes:

9

B. Direct Addressing:

10

C. Broadcast Addressing:

10

D. Multi-Cast Addressing:

10

9.

LEVEL 2 PROTOCOL:

11

A. Level 2 Instruction Types:

11

B. Level 2 Instruction Descriptions:

12

10. REGISTER DESCRIPTIONS:

14

11. SPECIAL FEATURES:

16

A. BIST Support:

16

B. RESET:

16

C. Port Synchronization:

16

12. ABSOLUTE MAXIMUM RATINGS:

18

13. RECOMMENDED OPERATING CONDITIONS:

18

14. DC ELECTRICAL CHARACTERISTICS:

18

15. AC ELECTRICAL CHARACTERISTICS:

20

16. AC WAVEFORMS:

22

17. APPENDIX:

24

A. State Diagram for Boundary-Scan TAP Control-

ler:

24

18. APPLICATIONS EXAMPLE:

24

TABLE 1. Glossary of Terms

LFSR

Linear Feedback Shift Register. When enabled, will generate a 16-bit signature of sampled serial

test data.

LSP

Local Scan Port. A four signal port that drives a “local” (i.e. non-backplane) scan chain. (e.g.,

TCK

Local

Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge

Test Access Port that drives them. The term “local” was adopted from the system test architecture

that the ’PSC110F Bridge will most commonly be used in; namely, a system test backplane with a

’PSC110F Bridge on each card driving up to 3 “local” scan rings per card. (Each card can contain

multiple ’PSC110Fs, with 3 local scan ports per ’PSC110F.)

Park/Unpark

Park, parked, unpark, and unparked, are used to describe the state of the LSP controller and the

state of the local TAP controllers (the “local TAP controllers” refers to the TAP controllers of the

scan components that make up a local scan ring). Park is also used to describe the action of

parking a LSP (transitioning into one of the Parked LSP controller states). It is important to

understand that when a LSP controller is in one of the parked states, TMS

thereby holding or “parking” the local TAP controllers in a given state.

TAP

Test Access Port as defined by IEEE Std. 1149.1

Selected/Unselected

Selected and Unselected refers to the state of the ’PSC110F Bridge Selection Controller. A

selected ’PSC110F has been properly addressed and is ready to receive Level 2 protocol.

Unselected ’PSC110Fs monitor the system test backplane, but do not accept Level 2 protocol

(except for the

GOTOWAIT instruction). The data registers and LSPs of unselected ’PSC110Fs are

not accessible from the system test master.

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