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ST7DALIF2 데이터시트(PDF) 145 Page - STMicroelectronics |
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ST7DALIF2 데이터시트(HTML) 145 Page - STMicroelectronics |
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145 / 171 page ![]() ST7DALIF2 Electrical characteristics 145/171 Table 86. Output driving current Symbol Parameter Conditions(1) Min Max Unit VOL (2) Output low level voltage for a standard I/O pin when 8 pins are sunk at same time (see Figure 75) IIO=+5 mA TA≤85° C TA≥85° C 1.0 1.2 V IIO=+2 mA TA≤85° C TA≥85° C 0.4 0.5 Output low level voltage for a high sink I/O pin when 4 pins are sunk at same time (see Figure 77) IIO=+20 mA,TA≤85° C TA≥85° C 1.3 1.5 IIO=+8 mA TA≤85° C TA≥85° C 0.75 0.85 VOH (3) Output high level voltage for an I/O pin when 4 pins are sourced at same time (see Figure 83) IIO=-5 mA, TA≤85° C TA≥85° C VDD-1.5 VDD-1.6 IIO=-2 mA TA≤85° C TA≥85° C VDD-0.8 VDD-1.0 VOL (2)(4) Output low level voltage for a standard I/O pin when 8 pins are sunk at same time (see Figure 74) IIO=+2 mA TA≤85° C TA≥85° C 0.5 0.6 Output low level voltage for a high sink I/O pin when 4 pins are sunk at same time IIO=+8 mA TA≤85° C TA≥85° C 0.5 0.6 VOH (3)(4) Output high level voltage for an I/O pin when 4 pins are sourced at same time IIO=-2mA TA≤85°C TA≥85°C VDD-0.8 VDD-1.0 VOL (2)(4) Output low level voltage for a standard I/O pin when 8 pins are sunk at same time (see Figure 73) IIO=+2 mA TA≤85° C TA≥85° C 0.6 0.7 Output low level voltage for a high sink I/O pin when 4 pins are sunk at same time IIO=+8 mA TA≤85° C TA≥85° C 0.6 0.7 VOH (3)(4) Output high level voltage for an I/O pin when 4 pins are sourced at same time (see Figure 80) IIO=-2 mA TA≤85° C TA≥85° C VDD-0.9 VDD-1.0 1. Subject to general operating conditions for VDD, fCPU, and TA unless otherwise specified. 2. The IIO current sunk must always respect the absolute maximum rating specified in Section 20.2 and the sum of IIO (I/O ports and control pins) must not exceed IVSS. 3. The IIO current sourced must always respect the absolute maximum rating specified in Section 20.2 and the sum of IIO (I/O ports and control pins) must not exceed IVDD. 4. Not tested in production, based on characterization results. |
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