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STM32F401CDU6 데이터시트(PDF) 89 Page - STMicroelectronics

부품명 STM32F401CDU6
상세설명  Clock, reset and supply management
PDF  135 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
홈페이지  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

STM32F401CDU6 데이터시트(HTML) 89 Page - STMicroelectronics

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STM32F401xD STM32F401xE
Electrical characteristics
114
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC code, is running. This emission test is compliant with SAE IEC61967-2
standard which specifies the test board and the pin loading.
6.3.14
Absolute maximum ratings (electrical sensitivity)
Based on three different tests (ESD, LU) using specific measurement methods, the device is
stressed in order to determine its performance in terms of electrical sensitivity.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test
conforms to the JESD22-A114/C101 standard.
Table 49. EMI characteristics for WLCSP49
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fCPU]
Unit
8/84 MHz
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C, conforming to
IEC61967-2
0.1 to 30 MHz
-4
dBµV
30 to 130 MHz
-4
130 MHz to 1 GHz
-2
SAE EMI Level
1.5
-
Table 50. EMI characteristics for LQFP100
Symbol
Parameter
Conditions
Monitored
frequency band
Max vs.
[fHSE/fCPU]
Unit
8/84 MHz
SEMI
Peak level
VDD = 3.6 V, TA = 25 °C, conforming to
IEC61967-2
0.1 to 30 MHz
19
dBµV
30 to 130 MHz
19
130 MHz to 1 GHz
11
SAE EMI Level
3.5
-



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