AD9286BCPZ-500 datasheet(20/28 Pages) AD

20 / 28 page

Data Sheet

AD9286

BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST

The AD9286 includes a built-in self-test feature that is designed

to enable verification of the integrity of each channel, as well as

facilitate board level debugging. A built-in self-test (BIST) feature

that verifies the integrity of the digital datapath of the AD9286

is included. Various output test options are also provided to

place predictable values on the outputs of the AD9286.

BUILT-IN SELF-TEST (BIST)

The BIST is a thorough test of the digital portion of the selected

AD9286 signal path. Perform the BIST test after a reset to ensure

that the part is in a known state. During BIST, data from an

internal pseudorandom noise (PN) source is driven through

the digital datapath of both channels, starting at the ADC block

output. At the datapath output, CRC logic calculates a signature

from the data. The BIST sequence runs for 512 cycles and then

stops. When the test is completed, the BIST compares the signature

results with a predetermined value. If the signatures match, the

BIST sets Bit 0 of Register 0x0E, signifying that the test passed.

If the BIST test fails, Bit 0 of Register 0x0E is cleared. The outputs

are connected during this test, so the PN sequence can be observed

as it runs.

Writing a value of 0x05 to Register 0x0E runs the BIST. This

enables the Bit 0 (BIST enable) of Register 0x0E and resets the PN

sequence generator, Bit 2 (BIST init) of Register 0x0E. At the

completion of the BIST, Bit 0 of Register 0x0E is automatically

cleared. The PN sequence can be continued from its last value

by writing a 0 to Bit 2 of Register 0x0E. However, if the PN

sequence is not reset, the signature calculation does not equal

the predetermined value at the end of the test. At that point, the

user must rely on verifying the output data.

OUTPUT TEST MODES

The output test options are described in Table 13 at Address 0x0D.

When an output test mode is enabled, the analog section of the

ADC is disconnected from the digital back-end blocks and the

test pattern is run through the output formatting block. Some

test patterns are subject to output formatting, and some are not.

The PN generators from the PN sequence tests can be reset by

setting Bit 4 or Bit 5 of Register 0x0D. These tests can be performed

with or without an analog signal (if present, the analog signal is

ignored), but they do require an encode clock. For more

information, see the AN-877 Application Note, Interfacing to

High Speed ADCs via SPI.

Rev. C | Page 19 of 27

AD9286BCPZ-500 데이터시트(PDF) 20 Page - Analog Devices

AD9286BCPZ-500 데이터시트(HTML) 20 Page - Analog Devices

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28

데이터시트 다운로드

링크 URL