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ST8034T 데이터시트(PDF) 14 Page - STMicroelectronics

부품명 ST8034T
상세설명  16-pin smartcard interfaces
PDF  39 Pages
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제조업체  STMICROELECTRONICS [STMicroelectronics]
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ST8034T 데이터시트(HTML) 14 Page - STMicroelectronics

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ST8034T, ST8034AT, ST8034P, ST8034C
Electrical characteristics
ICC(SHDN)
VCC output current in
shutdown mode
VCC connected to GND
-1
mA
tW_VCC(5V)
CMDVCC pulse width for
VCC = 5 V, all versions
except ST8034P
See section Section 6.10.1 on page 31
30
ms
tW_VCC(3V)
CMDVCC pulse width for
VCC = 3 V, all versions
except ST8034P
See section Section 6.10.1 on page 31
15
ms
Device supply voltages monitoring
VTH
Falling supply voltage
threshold
VDD pin
2.3
2.4
2.5
V
VDDP pin (VCC = 5 V)
3.0
4.1
4.4
VDDP pin (VCC = 3 V or 1.8 V)
2.3
2.4
2.5
VDD(INTF) pin (ST8034T, ST8034AT)
1.20
1.24
1.29
PORADJ pin (ST8034P, ST8034C)
1.20
1.24
1.29
VHYS
Hysteresis on supply
voltage threshold
VDD pin
50
100
150
mV
VDDP pin (VCC = 5 V)
100
200
350
VDDP pin (VCC = 3 V or 1.8 V)
50
100
150
VDD(INTF) pin (ST8034T, ST8034AT)
10
20
30
PORADJ pin (ST8034P, ST8034C)
10
20
30
II(PORADJ) Input current, PORADJ pin
-1
1
A
tW
Power-on or undervoltage
reset pulse width (minimum)
5.1
8
10.2
ms
1. TA = 25 °C, VDD = 3.3 V, VDDP = 5 V, VDD(INTF) = 3.3 V, fXTAL = 10 MHz, unless otherwise noted.
2. The device can operate at VDD supply voltage up to 5.5 V, however the specified parameters (mainly related to current
consumption and input currents) are guaranteed in the basic VDD range 2.7 to 3.6 V.
3. The device can operate at VDD(INTF) supply voltage up to 5.5 V, however the specified parameters (mainly related to current
consumption) are guaranteed in the basic VDD(INTF) range 1.6 to 3.6 V.
4. These current pulses are filtered by the decoupling capacitors on the VCC pin, therefore for the LDO just the mean value
matters.
5. Two low ESR (< 350 m
) ceramic capacitors for VCC decoupling recommended: 100 nF ± 20% (up to
330 nF ± 20%) close to the ST8034 and 100 nF ± 20% (up to 330 nF ± 20%) close to the card.
Table 7. Supply voltages (continued)
Symbol
Parameter
Test conditions(1)
Min.
Typ.
Max.
Unit



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