LF451 datasheet(3/8 Pages) NSC

3 / 8 page

Note 7

Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level)

Note 8

Design limits are guaranteed to National’s AOQL but not 100% tested

Note 9

The input bias currents are junction leakage currents which approximately double for every 10 C increase in the junction temperature TJ Due to limited

production test time the input bias currents are correlated to junction temperature In normal operation the junction temperature rises above the ambient

temperature as a result of internal power dissipation PD TJ e TA a iJAPD where iJA is the thermal resistance from junction to ambient

Note 10

VOS IB AVOL and IOS are measured at VCM e 0V

Note 11

Supply voltage rejection ratio is measured for both supply magnitudes increasing or decreasing simultaneously in accordance with common practice

Typical Performance Characteristics

Distortion vs Frequency

Voltage Swing

Undistorted Output

Response

Open Loop Frequency

Rejection Ratio

Common-Mode

Rejection Ratio

Power Supply

Noise Voltage

Equivalent Input

Gain (VV)

Open Loop Voltage

Output Impedance

Inverter Settling Time

TLH9660 – 5

LF451 데이터시트(PDF) 3 Page - National Semiconductor (TI)

LF451 데이터시트(HTML) 3 Page - National Semiconductor (TI)

Html Pages

1 2 3 4 5 6 7 8

데이터시트 다운로드

링크 URL