| 전자부품 데이터시트 검색엔진 |
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RT9737WSC 데이터시트(PDF) 4 Page - Richtek Technology Corporation |
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RT9737WSC 데이터시트(HTML) 4 Page - Richtek Technology Corporation |
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4 / 7 page ![]() RT9737 Copyright © 2014 Richtek Technology Corporation. All rights reserved. is a registered trademark of Richtek Technology Corporation www.richtek.com DS9737-00 February 2014 4 Parameter Symbol Test Conditions Min Typ Max Unit Digital I/O Input Logic-Hi Threshold VIH 1.4 -- -- V Input Logic-Low Threshold VIL -- -- 0.4 V Input Leakage Current SEL = 0V or VDDEN 0.1 -- 0.1 A Note 1. Stresses beyond those listed “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Note 2. JA is measured at TA = 25C on a high effective thermal conductivity four-layer test board per JEDEC 51-7. Note 3. Devices are ESD sensitive. Handling precaution is recommended. Note 4. The device is not guaranteed to function outside its operating conditions. Note 5. Guarantee by design. Typical Application Circuit SEL OUTA OUTB VDDEN INA1 INB1 INA2 INB2 GND Audio Amplifier 1 Audio Amplifier 2 Audio Connector RT9737 0.1 μF 2.5 to 5.5V A1 A2 A3 B3 B1 C1 C2 C3 B2 CVDDEN |
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