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ADC12DL040 데이터시트(PDF) 21 Page - National Semiconductor (TI) |
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ADC12DL040 데이터시트(HTML) 21 Page - National Semiconductor (TI) |
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21 / 26 page ![]() Applications Information (Continued) data in the ASIC thus avoiding the use of the CLK signal altogether. However, since the ABb signal edges are pro- vided in-phase with the data transitions, generally the ASIC circuitry would have to delay the ABb signal with respect to the data in order to use it as the clock for the capturing latches. It is also possible to use the CLK signal to latch the data in the multiplexed mode as well - as described in the previous paragraph. Be very careful when driving a high capacitance bus. The more capacitance the output drivers must charge for each conversion, the more instantaneous digital current flows through V DR and DR GND. These large charging current spikes can cause on-chip ground noise and couple into the analog circuitry, degrading dynamic performance. Adequate bypassing, limiting output capacitance and careful attention to the ground plane will reduce this problem. Additionally, bus capacitance beyond the specified 15 pF/pin will cause t OD to increase, making it difficult to properly latch the ADC output data. The result could be an apparent reduction in dynamic performance. To minimize noise due to output switching, minimize the load currents at the digital outputs. This can be done by connect- ing buffers (74ACQ541, for example) between the ADC out- puts and any other circuitry. Only one driven input should be connected to each output pin. Additionally, inserting series resistors of about 100 Ω at the digital outputs, close to the ADC pins, will isolate the outputs from trace and other circuit capacitances and limit the output currents, which could oth- erwise result in performance degradation. See Figure 4. 20100213 FIGURE 4. Application Circuit using Transformer or Differential Op-Amp Drive Circuit, Parallel mode www.national.com 21 |
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