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DS3152 데이터시트(PDF) 32 Page - Dallas Semiconductor |
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DS3152 데이터시트(HTML) 32 Page - Dallas Semiconductor |
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32 / 60 page ![]() DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs 32 of 60 12. JTAG TEST ACCESS PORT AND BOUNDARY SCAN 12.1 JTAG Description The DS315x LIUs support the standard instruction codes SAMPLE/PRELOAD, BYPASS, and EXTEST. Optional public instructions included are HIGHZ, CLAMP, and IDCODE. Figure 12-1 features a block diagram. The LIUs contain the following items, which meet the requirements set by the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture: Test Access Port (TAP) TAP Controller Instruction Register Bypass Register Boundary Scan Register Device Identification Register The TAP has the necessary interface pins, namely JTCLK, JTRST, JTDI, JTDO, and JTMS. Details on these pins can be found in Section 4. Details about the boundary scan architecture and the TAP can be found in IEEE 1149.1- 1990, IEEE 1149.1a-1993, and IEEE 1149.1b-1994. Figure 12-1. JTAG Block Diagram BOUNDARY SCAN REGISTER IDENTIFICATION REGISTER BYPASS REGISTER INSTRUCTION REGISTER TEST ACCESS PORT CONTROLLER SELECT TRI-STATE JTDI 10k JTMS 10k JTCLK JTRST 10k JTDO |
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