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M8888-R1 데이터시트(PDF) 8 Page - Clare, Inc.

부품명 M8888-R1
상세설명  DTMF Transceiver
PDF  14 Pages
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제조업체  CLARE [Clare, Inc.]
홈페이지  http://www.clare.com
Logo CLARE - Clare, Inc.

M8888-R1 데이터시트(HTML) 8 Page - Clare, Inc.

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DC Characteristics
Parameter
Symbol
Min
Typ*
Max
Units
Operating supply voltage
V
DD
4.75
5.0
5.25
V
Operating supply current
I
DD
-10
15
mA
Power consumption
P
O
-
50
78.75
mW
Inputs
High-level input voltage, OSC1
V
IHO
3.5
-
-
V
Low-level input voltage, OSC1
V
ILO
-
-
1.5
V
Input impedance (@ 1 KHz), IN+, IN-
R
IN
-10
-
M
Steering threshold voltage
V
TSt
2.2
2.3
2.5
V
Outputs
High-level output voltage (no load), OSC2
V
OHO
V
DD - 0.1V
-
-
V
Low-level output voltage (no load), OSC2
V
OLO
-
-
0.1
V
Output leakage current (V
OH = 2.4V), IRQ
I
OZ
-
1.0
10.0
µA
V
REF output voltage (no load)
V
REF
2.4
-
2.7
V
V
REF output resistance
R
OR
-
-
1.0
k
Data Bus
Low-level input voltage
V
IL
-
-
0.8
V
High-level input voltage
V
IH
2.0
-
-
V
Low-level output voltage (I
OL = 1.6 mA)
V
OL
-
-
0.4
V
High-level output voltage (I
OH = 400 µA)
V
OH
2.4
-
-
V
Input leakage current (V
IN = 0.4 to 2.4 V)
I
IZ
-
-
10.0
µA
All voltages referenced to V
SS unless otherwise noted. VDD = 5.0 V ± 5%; fC = 3.579545 MHz; TA = -40°C to +85°C unless otherwise noted.
*Typical values are for use as design aids only, and are not guaranteed or subject to production testing.
Parameter
Symbol
Value
Power supply voltage
(V
DD - VSS)VDD
+ 6.0 V max
Voltage on any pin
V
dc
V
SS -0.3 V to VDD + 0.3V
Current on any pin
I
DD
10 mA max
Operating temperature
T
A
-40°C to +85°C
Storage temperature
T
S
-65°C to +150°C
Note: Exceeding these ratings may cause permanent damage. Functional operation under these
conditions is not implied.
www.clare.com
8
M-8888
Rev. 1
Absolute Maximum Ratings
Absolute Maximum Ratings are stress ratings. Stresses in
excess of these ratings can cause permanent damage to
the device. Functional operation of the device at these or
any other conditions beyond those indicated in the opera-
tional sections of this data sheet is not implied. Exposure of
the device to the absolute maximum ratings for an extend-
ed period may degrade the device and effect its reliability.



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