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RA32E1-RUT-FR 데이터시트(PDF) 12 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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RA32E1-RUT-FR 데이터시트(HTML) 12 Page - SHENZHEN REFOND OPTOELECTRONICS CO.,LTD. |
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12 / 20 page ![]() Tel: +86-755-66839118 Fax:+86-755-66839300 E-mail:uvsales@refond.com W eb: www.refonduv.com PAGE:12 REFOND:WI-E-045 A/3 REV:E/3 TG-201709070731NP 2.3 Cardboard Box Fig.2-5 Cardboard Box 2.4 Reliability Test Items And Conditions Table 2-3 Reliability Test Items And Conditions Test Items Ref.Standard Test Condition Time Quantity Ac/Re Reflow JESD22-B106 Temp:260℃max T=10 sec 3times. 10Pcs. 0/1 Temperature Cycle JESD22-A104 100℃ 30 min. ↑↓5 min -40℃ 30 min. 300 Cycles 10Pcs. 0/1 Thermal Shock JESD22-A106 -40℃ 15min ↑↓10s 100℃ 15min 300 Cycles 10Pcs. 0/1 High Temperature Storage JESD22-A103 Temp:100℃ 1000Hrs. 10Pcs. 0/1 Low Temperature Storage JESD22-A119 Temp:-40℃ 1000Hrs. 10Pcs. 0/1 Life Test JESD22-A108 Ta=25℃ IF=100mA 1000Hrs. 10Pcs. 0/1 深圳市瑞丰光电子股份有限公司 SHENZHEN REFOND OPTOELECTRONICS CO.LTO. |
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