KMA310 datasheet(57/71 Pages) NXP

57 / 71 page

NXP Semiconductors

KMA310

Programmable angle sensor IC

KMA310

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Product data sheet

Rev. 3 — 27 February 2019

57 / 71

17.2.1 Absorber lined shielded enclosure

Tests according to ISO 11452-2, second edition (2004-11), were fulfilled.

Test level: 200 V/m; extended up to 4 GHz.

State: A.

17.2.2 Bulk-current injection

Tests according to ISO 11452-4, fourth edition (2011-12), were fulfilled.

Test level: 200 mA.

State: A.

17.2.3 Strip line

Tests according to ISO 11452-5, second edition (2002-04), were fulfilled.

Test level: 200 V/m; extended up to 1 GHz.

State: A.

17.2.4 Immunity against mobile phones

Tests according to ISO 11452-2, second edition (2004-11), were fulfilled.

State: A.

Definition of global system for mobile (GSM) communications signal:

• Pulse modulation: per GSM specification (217 Hz; 12.5 % duty cycle)

• Modulation grade: ≥60 dB

• Sweep: linear 800 MHz to 3 GHz

• Antenna polarization: vertical, horizontal

• Field strength: 200 V/m during on-time [calibration in continuous wave (CW)]

In deviation of ISO 11452-2, a GSM signal instead of an AM signal was used.

17.3 Electrical transient transmission (ISO 7637-3 second edition

[2007-07])

The common understanding of the requested function is that an effect is tolerated as

described in Table 65 during the disturbance.

17.3.1 Capacitive coupling

Tests according to ISO 7637-3 were fulfilled.

Test level: IV (for 12 V electrical system).

Classification level: B for pulse fast a, B for pulse fast b.

17.3.2 Inductive coupling

Tests according to ISO 7637-3 were fulfilled.

Test level: IV (for 12 V electrical system).

KMA310 데이터시트(PDF) 57 Page - NXP Semiconductors