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FS32K112BHTXVLFTR 데이터시트(PDF) 41 Page - NXP Semiconductors

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6.2.3.2 Slow internal RC oscillator (SIRC) electrical specifications
Table 31. Slow internal RC oscillator (SIRC) electrical specifications for S32K1xx series
Symbol
Parameter
Value
Unit
Min.
Typ.
Max.
FSIRC
SIRC target frequency
—
8
—
MHz
ΔF
Frequency deviation across process, voltage, and
temperature < 105°C
—
—
±3
%FSIRC
ΔF125
Frequency deviation across process, voltage, and
temperature < 125°C
—
—
±3.3
%FSIRC
TStartup
Startup time
—
9
12.5
µs1
1. Startup time is defined as the time between clock enablement and clock availability for system use.
Table 32. Slow internal RC oscillator (SIRC) electrical specifications for S32K14xW series
Symbol
Parameter
Value
Unit
Min.
Typ.
Max.
FSIRC
SIRC target frequency
—
8
—
MHz
ΔF
Frequency deviation across process, voltage, and
temperature
—
—
±3.3
%FSIRC
TStartup
Startup time
—
9
12.5
µs1
1. Startup time is defined as the time between clock enablement and clock availability for system use.
6.2.4 Low Power Oscillator (LPO) electrical specifications
Table 33. Low Power Oscillator (LPO) electrical specifications
Symbol
Parameter
Value
Unit
Min.
Typ.
Max.
S32K1xx/
S32K14xW
S32K1xx/
S32K14xW
S32K1xx
S32K14xW
FLPO
Internal low power oscillator
frequency
113
128
139
141
kHz
Tstartup
Startup Time
—
—
20
µs
System Clock Generation (SCG) specifications
S32K1xx Data Sheet, Rev. 12, 02/2020
NXP Semiconductors
41



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