| 전자부품 데이터시트 검색엔진 |
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SWIFO111E 데이터시트(PDF) 8 Page - Seoul Semiconductor |
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SWIFO111E 데이터시트(HTML) 8 Page - Seoul Semiconductor |
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8 / 23 page ![]() R00 January 9, 2020 www.seoulsemicon.com Product Data Sheet SWIFO111E – WICOP 8 Reliability Test Item Reference Test Condition Duration / Cycle Number of Damage Room Temperature Operating Test - T a = 25℃, I F =650mA 1,000 Hours 0/20 High Temperature Operating Test 1 - T a = 60℃, I F =650mA 1,000 Hours 0/20 High Temperature Operating Test 2 - T a = 85℃, I F =650mA 1,000 Hours 0/20 Wet High Temperature Operating Life(WHTOL) - T a =60 o C, RH=90%, I F =650mA 1,000hours 0/20 ESD Test - 2kV @ R1:10M Ω, R2:1.5KΩ, C:100pF 3 time 0/20 Item Symbol Condition Criteria for Judgment MIN MAX Forward Voltage V F I F =650mA - I.V. *1 × 1.2 Luminous Flux ФV I F =650mA I.V. *1 × 0.7 - Table 3. Test Items and Results Table 4. Criteria for Judging the Damage Notes : *(1) I.V. : Initial Value |
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