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PRT2011CVL4A 데이터시트(PDF) 49 Page - NXP Semiconductors |
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PRT2011CVL4A 데이터시트(HTML) 49 Page - NXP Semiconductors |
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49 / 113 page ![]() Electrical Characteristics i.MX RT1064 Crossover Processors for Industrial Products, Rev. 2, 08/2020 NXP Semiconductors 49 Figure 19. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X0, 0X1 NOTE Timing shown is based on the memory generating read data on the SCK falling edge, and FlexSPI controller sampling read data on the falling edge. 4.5.2.1.2 SDR mode with FlexSPIn_MCR0[RXCLKSRC] = 0x3 There are two cases when the memory provides both read data and the read strobe in SDR mode: • A1—Memory generates both read data and read strobe on SCK rising edge (or falling edge) • A2—Memory generates read data on SCK falling edge and generates read strobe on SCK rising edgeSCK rising edge Figure 20. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0X3 (case A1) Table 39. FlexSPI input timing in SDR mode where FlexSPIn_MCR0[RXCLKSRC] = 0x3 (case A1) Symbol Parameter Value Unit Min Max Frequency of operation — 166 MHz TSCKD Time from SCK to data valid — — ns TSCKDQS Time from SCK to DQS — — ns TSCKD - TSCKDQS Time delta between TSCKD and TSCKDQS -2 2 ns TIS TIH SCK SIO[0:7] TIS TIH Internal Sample Clock TSCKDQS SCK SIO[0:7] DQS TSCKD TSCKDQS TSCKD |
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