6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1)

MIN

MAX

UNIT

Power supply voltage

−0.3

3.6

V

IO input voltage

−0.3

3.6

V

Junction temperature

125

°C

Storage temperature

−65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress

ratings only, which do not imply functional operation of the device at these or any other conditions beyond those indicated

under Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device

reliability.

6.2 ESD Ratings

VALUE

UNIT

Electrostatic discharge

Human body model (HBM), per ANSI/ESDA/JEDEC

JS-001, all pins(1)

±3500

V

Charged device model (CDM), per JEDEC

specification JESD22-C101, all pins(2)

±1000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

IO, Core supply voltage

3

3.3

3.6

V

Input supply voltage

3

3.3

3.6

V

Ambient temperature

−40

105

°C

6.4 Thermal Information

THERMAL METRIC(1)

Device Package

UNIT

RSL (QFN)

48 PINS

Junction-to-ambient thermal resistance

32.2

°C/W

Junction-to-case (top) thermal resistance

22.3

°C/W

Junction-to-board thermal resistance

14.3

°C/W

Junction-to-top characterization parameter

0.5

°C/W

Junction-to-board characterization parameter

14.2

°C/W

Junction-to-case (bottom) thermal resistance

6.1

°C/W

(1)

For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application

report.

CDCDB800

SNAS818 – JULY 2021

www.ti.com

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