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전자부품 데이터시트 검색엔진 |
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전자부품 데이터시트 검색엔진 |
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ECE1200 데이터시트(PDF) 12 Page - Microchip Technology |
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ECE1200 데이터시트(HTML) 12 Page - Microchip Technology |
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12 / 87 page  ECE1200 DS00003093C Draft-page 12 2018-2021 Microchip Technology Inc. 2.3 Strapping Options 2.3.1 TEST PIN The pin named TEST must be kept permanently low in normal operation. It may be pulled high only for test purposes, and when high it redefines all pin functions. See Section 7.0, "Test Mechanisms," on page 58. 2.3.2 ESPI_STRAP_0, ESPI_STRAP_1 PINS These pins should remain open (N/C) except for test purposes. They are included as inputs to the XNOR Chain test mode. 2.3.3 BOOT_DONE PIN This pin defines whether the eSPI role of the ECE1200 is as a Primary Slave or a Secondary Slave. It may be strapped in the system, or it may be dynamically changed (once) in the power-on sequence. The state of BOOT_DONE selects the multiplexed output function of pin SUSPWRDNACK / HOST_RST_ACK: • BOOT_DONE=1: SUSPWRDNACK • BOOT_DONE=0: HOST_RST_ACK See Section 5.5.2, "BOOT_DONE," on page 27 for details of its usage. See also the figures in Section 1.1, "System Block Diagrams," on page 5 for connection examples and notes for application. |
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