Maximum rating

NAND01G-N

18/23

Rev1.0

4

Maximum rating

Stressing the device above the rating listed in the Absolute Maximum Ratings table may

cause permanent damage to the device. These are stress ratings only and operation of the

device at these or any other conditions above those indicated in the Operating sections of

this specification is not implied. Exposure to Absolute Maximum Rating conditions for

extended periods may affect device reliability. Refer also to the STMicroelectronics SURE

Program and other relevant quality documents.

Table 3.

Absolute Maximum Ratings

Symbol

Parameter

Value

Unit

Min

Max

Ambient Operating Temperature

-30

85

°C

TBD

TBD

°C

Storage Temperature

-55

125

°C

NAND Flash Input or Output Voltage

1.8V

-0.6

2.7

V

LPSDRAM Input or Output Voltage

1.8V

-1.0

2.6

V

NAND Flash Supply Voltage

1.8V

-0.6

2.7

V

LPSDRAM Supply Voltage

1.8V

-1.0

2.6

V

LPSDRAM Short Circuit

Output Current

50

mA

LPSDRAM Power

Dissipation

PD

1

W

1.

TBD stands for ‘To Be Determined’.