| 전자부품 데이터시트 검색엔진 |
|
UCS2113 데이터시트(PDF) 9 Page - Microchip Technology |
|
|
|||||||||||||||||||||||||||||
UCS2113 데이터시트(HTML) 9 Page - Microchip Technology |
|
9 / 62 page ![]() 2016-2021 Microchip Technology Inc. and its subsidiaries DS20005680B-page 9 UCS2113 1.1 ESD and Transient Performance 1.1.1 HUMAN BODY MODEL (HBM) PERFORMANCE HBM testing verifies the ability to withstand ESD strikes, like those that occur during handling and manufacturing, and is done without power applied to the IC. To pass the test, the device must have no change in operation or performance due to the event. 1.1.2 CHARGED DEVICE MODEL (CDM) PERFORMANCE CDM testing verifies the ability to withstand ESD strikes, like those that occur during handling and assembly, with pick-and-place-style machinery and is done without power applied to the IC. To pass the test, the device must have no change in operation or performance due to the event. TABLE 1-4: ESD RATINGS ESD Specification Rating or Value Human Body Model (JEDEC JESD22-A114) - All pins 8 kV Charged Device Model (JEDEC JESD22-C101) - All pins 500V |
|
링크 URL |
| ALLDATASHEET 가 귀하에 도움이 되셨나요? [ DONATE ] |
Alldatasheet는? | 광고문의 | 운영자에게 연락하기 | 개인정보취급방침 | 링크 투 데이터시트 | 링크교환 | 제조사별 검색 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |