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STP45N60DM6 데이터시트(PDF) 3 Page - STMicroelectronics |
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STP45N60DM6 데이터시트(HTML) 3 Page - STMicroelectronics |
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3 / 15 page ![]() 2 Electrical characteristics TC = 25 °C unless otherwise specified Table 4. On/off states Symbol Parameter Test conditions Min. Typ. Max. Unit V(BR)DSS Drain-source breakdown voltage VGS = 0 V, ID = 1 mA 600 V IDSS Zero gate voltage drain current VGS = 0 V, VDS = 600 V 5 µA VGS = 0 V, VDS = 600 V, TC = 125 °C(1) 100 µA IGSS Gate-body leakage current VDS = 0 V, VGS = ±25 V ±5 µA VGS(th) Gate threshold voltage VDS = VGS, ID = 250 µA 3.25 4 4.75 V RDS(on) Static drain-source on-resistance VGS = 10 V, ID = 15 A 0.085 0.099 Ω 1. Defined by design, not subject to production test Table 5. Dynamic Symbol Parameter Test conditions Min. Typ. Max. Unit Ciss Input capacitance VDS= 100 V, f = 1 MHz, VGS = 0 V - 1920 - pF Coss Output capacitance - 120 - pF Crss Reverse transfer capacitance - 2 - pF Coss eq. (1) Equivalent output capacitance VDS = 0 to 480 V, VGS = 0 V - 310 - pF RG Intrinsic gate resistance f = 1 MHz, ID = 0 A - 1.5 - Ω Qg Total gate charge VDD = 480 V, ID = 30 A, VGS = 0 to 10 V (see )Figure 16. Test circuit for gate charge behavior - 44 - nC Qgs Gate-source charge - 10 - nC Qgd Gate-drain charge - 25 - nC 1. Coss eq. is defined as a constant equivalent capacitance giving the same charging time as Coss when VDS increases from 0 to 80% VDSS Table 6. Switching times Symbol Parameter Test conditions Min. Typ. Max. Unit td(on) Turn-on delay time VDD = 300 V, ID = 15 A RG = 4.7 Ω, VGS = 10 V (see Figure 17. Test circuit for inductive load switching and diode recovery times) and Figure 20. Switching time waveform - 15 - ns tr Rise time - 5.3 - ns td(off) Turn-off-delay time - 50 - ns tf Fall time - 7.3 - ns STP45N60DM6, STW45N60DM6 Electrical characteristics DS11664 - Rev 3 page 3/15 |
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