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SPC58ECX 데이터시트(PDF) 52 Page - STMicroelectronics |
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SPC58ECX 데이터시트(HTML) 52 Page - STMicroelectronics |
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52 / 153 page ![]() Electrical characteristics SPC584Cx, SPC58ECx 52/153 DS11620 Rev 8 ΔTUE12 CC D TUE degradation due to VDD_HV_ADR offset with respect to VDD_HV_ADV VIN < VDD_HV_ADV VDD_HV_ADR − VDD_HV_ADV ∈ [0:25 mV] –1 1 LSB (12b) VIN < VDD_HV_ADV VDD_HV_ADR − VDD_HV_ADV ∈ [25:50 mV] –2 2 VIN < VDD_HV_ADV VDD_HV_ADR − VDD_HV_ADV ∈ [50:75 mV] –4 4 VIN < VDD_HV_ADV VDD_HV_ADR − VDD_HV_ADV ∈ [75:100 mV] –6 6 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR − VDD_HV_ADV ∈ [0:25 mV] –2.5 2.5 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR − VDD_HV_ADV ∈ [25:50 mV] –4 4 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR − VDD_HV_ADV ∈ [50:75 mV] –7 7 VDD_HV_ADV < VIN < VDD_HV_ADR VDD_HV_ADR − VDD_HV_ADV ∈ [75:100 mV] –12 12 DNL(8) CC P Differential non- linearity Standard frequency mode, VDD_HV_ADV > 4 V VDD_HV_ADR_S > 4 V –1 2 LSB (12b) T High frequency mode, VDD_HV_ADV > 4 V VDD_HV_ADR_S > 4 V –1 2 1. Minimum ADC sample times are dependent on adequate charge transfer from the external driving circuit to the internal sample capacitor. The time constant of the entire circuit must allow the sampling capacitor to charge within 1/2 LSB within the sampling window. Refer to Figure 8 for models of the internal ADC circuit, and the values to use in external RC sizing and calculating the sampling window duration. 2. Mode1: 6 sampling cycles + 10 conversion cycles at 13.33 MHz. 3. Mode2: 5 sampling cycles + 10 conversion cycles at 13.33 MHz. 4. Mode3: 6 sampling cycles + 10 conversion cycles at 16 MHz. 5. IADCREFH and IADCREFL are independent from ADC clock frequency. It depends on conversion rate: consumption is driven by the transfer of charge between internal capacitances during the conversion. 6. Current parameter values are for a single ADC. Table 27. SARn ADC electrical specification (continued) Symbol C Parameter Conditions Value Unit Min Max |
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