M76DW52003TA datasheet(13/27 Pages) STMICROELECTRONICS

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M76DW52003TA, M76DW52003BA

DC AND AC PARAMETERS

This section summarizes the operating and mea-

surement conditions, and the DC and AC charac-

teristics of the device. The parameters in the DC

and AC characteristics Tables that follow, are de-

rived from tests performed under the Measure-

ment

Conditions

summarized

Table

Operating and AC Measurement Conditions. De-

signers should check that the operating conditions

in their circuit match the measurement conditions

when relying on the quoted parameters.

The operating and AC measurement parameters

given in this section (see Table 4 below) corre-

spond to those of the stand-alone Flash and

SRAM devices. For compatibility purposes, the

M29DW323D voltage range is restricted to VCCS

in the stacked product.

Table 4. Operating and AC Measurement Conditions

Figure 6. AC Measurement I/O Waveform

Figure 7. AC Measurement Load Circuit

Table 5. Device Capacitance

Note: Sampled only, not 100% tested.

Parameter

Flash Memory

SRAM

Units

Min

Max

Min

Max

VCCF Supply Voltage

2.7

3.6

–

VCCS Supply Voltage

–

2.7

3.3

Ambient Operating Temperature

–40

°C

Load Capacitance (CL)

Input Rise and Fall Times

3.3

Input Pulse Voltages

0 to VCCF

Input and Output Timing Ref. Voltages

VCCF/2

AI08186

VCCF

VCCF/2

AI08187

VCCF

CL includes JIG capacitance

25k

Ω

DEVICE

UNDER

TEST

0.1µF

VCCF

0.1µF

VPP

25k

Ω

Symbol

Parameter

Test Condition

Typ

Max

Unit

CIN

Input Capacitance

VIN = 0V, f=1 MHz

COUT

Output Capacitance

VOUT = 0V, f=1 MHz

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