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NB2304AI2DG 데이터시트(PDF) 6 Page - ON Semiconductor

부품명 NB2304AI2DG
상세설명  3.3 V Zero Delay Clock Buffer
PDF  10 Pages
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제조업체  ONSEMI [ON Semiconductor]
홈페이지  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NB2304AI2DG 데이터시트(HTML) 6 Page - ON Semiconductor

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Table 8. SWITCHING CHARACTERISTICS FOR INDUSTRIAL TEMPERATURE DEVICES
(All parameters are specified with loaded outputs)
Parameter
Description
Test Conditions
Min
Typ
Max
Unit
t1
Output Frequency
30 pF load (all devices)
15 pF load (−1, −2)
15
15
100
133.3
MHz
t1
Duty Cycle = (t2 / t1) * 100
(all devices)
Measured at 1.4 V, FOUT v 66.66 MHz
30 pF load
40.0
50.0
60.0
%
Measured at 1.4 V, FOUT v 50 MHz
15 pF load
45.0
50.0
55.0
t3
Output Rise Time
(−1, −2)
Measured between 0.8 V and 2.0 V
30 pF load
2.50
ns
Measured between 0.8 V and 2.0 V
15 pF load
1.50
Output Rise Time
(−1H)
Measured between 0.8 V and 2.0 V
30 pF load
1.50
t4
Output Fall Time
(−1, −2)
Measured between 2.0 V and 0.8 V
30 pF load
2.50
ns
Measured between 2.0 V and 0.8 V
15 pF load
1.50
Output Fall Time
(−1H)
Measured between 2.0 V and 0.8 V
30 pF load
1.25
t5
Output−to−Output Skew on same Bank
(−1, −2)
All outputs equally loaded
200
ps
Output−to−Output Skew
(−1H)
All outputs equally loaded
200
Output Bank A−to−Output Bank B skew
(−1)
All outputs equally loaded
200
Output Bank A−to−Output Bank B skew
(−2)
All outputs equally loaded
400
t6
Delay, REF Rising Edge to FBK Rising
Edge
Measured at VDD/2
0
±250
ps
t7
Device−to−Device Skew
Measured at VDD/2 on the FBK pins of the
device
0
500
ps
t8
Output Slew Rate
Measured between 0.8 V and 2.0 V using
Test Circuit #2
1
V/ns
tJ
Cycle−to−Cycle Jitter
(−1, −1H)
Measured at 66.67 MHz, loaded outputs,
15 pF load
180
ps
Measured at 66.67 MHz, loaded outputs,
30 pF load
200
Measured at 133.3 MHz, loaded outputs,
15 pF load
100
Cycle−to−Cycle Jitter
(−2)
Measured at 66.67 MHz, loaded outputs,
30 pF load
400
ps
Measured at 66.67 MHz, loaded outputs,
15 pF load
380
tLOCK
PLL Lock Time
Stable power supply, valid clock presented
on REF and FBK pins
1.0
ms



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