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CLC031VEC 데이터시트(PDF) 8 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
부품명 CLC031VEC
상세설명  SMPTE 292M/259M Digital Video Deserializer / Descrambler with Video and Ancilliary Data FIFOs
PDF  31 Pages
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제조업체  NSC [National Semiconductor (TI)]
홈페이지  http://www.national.com
Logo NSC - National Semiconductor (TI)

CLC031VEC 데이터시트(HTML) 8 Page - National Semiconductor (TI)

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AC Electrical Characteristics (Continued)
Note 3: Typical values are stated for VDDIO =VDDSI = +3.3V, VDDD =VDDPLL = +2.5V and TA = +25˚C.
Note 4: Spec. is guaranteed by design.
Note 5: Measured from rising-edge of first SDI cycle until Lock Detect bit goes high (true). Lock time includes CDR phase acquisition time plus PLL lock time.
Note 6: VOHV and VOLP are measured with respect to reference ground. VOLP is the peak output LOW voltage or ground bounce that may occur under dynamic
simultaneous output switching conditions. VOHV is the lowest output HIGH voltage or output droop that may occur under dynamic simultaneous output switching
conditions.
Note 7: When used to clock control data into or from the CLC031, the duty cycle restriction does not apply.
Note 8: IIH includes static current required by input pull-down devices.
Note 9: Required Input Conditions are the electrical signal conditions or component values which shall be supplied by the circuit in which this device is used in order
for it to produce the specified DC and AC electrical output characteristics.
Note 10: Functional and certain other parametric tests utilize a CLC030 as the input source to the SDI inputs of the CLC031. The CLC030 is DC coupled to the
inputs of the CLC031. Typical VIN = 800 mV, VCM = 2.9 V.
Test Loads
20020104
www.national.com
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