SPECIFICATION AND PERFORMANCE

SERIES:

115B Series

FILE:

115B Series_spec

DATE:

2012/12/12

The information contained herein is exclusive property of. Do not copy and print except that Attend accepts.

本文件係屬立威科技股份有限公司所有；非經同意，不得以任何覆寫、拷貝、翻印等方式私自據有。亦不得擅加毀損、塗改。

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ELECTRICAL

Item

Requirement

Test Condition

Contact Resistance

Initial:

30 mΩ Maximum

After test:

30 mΩ Maximum

(EIA 364-23 )

Subject mated contacts assembled in

housing to 20mV maximum open circuit at

100 mA maximum The object of this test is

to detail a standard method to measure

the electrical resistance across a pair of

mated contacts such that the insulating

films, if present will not be broken or

asperity melting will not occur.

Insulation Resistance Insulation Resistance:

1000MΩMin

(EIA 364-21 )

Apply a 500V DC between adjacent

terminals and between terminals to

ground

Dielectric

Withstanding

Voltage

No flashover or

insulation breakdown

(EIA 364-20 )

Apply a voltage 500V AC R.M.S for 1

minute between adjacent terminals and

between terminals to ground

MECHANICAL

Item

Requirement

Test Condition

Durability

No physical damage.

(EIA 364-09 )

Insertion and extraction are repeated

5000 cycles with the actually card at the

speed rate of 700 min cycles/hour.

Exchange the actually card every

2000cycles.