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UPD754264 데이터시트(PDF) 28 Page - Renesas Technology Corp |
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UPD754264 데이터시트(HTML) 28 Page - Renesas Technology Corp |
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28 / 69 page ![]() µPD754264 26 Data Sheet U12487EJ1V2DS 8. INTERRUPT FUNCTION AND TEST FUNCTION Figure 8-1 shows the interrupt control circuit. Each hardware device is mapped in the data memory space. The interrupt control circuit of the µPD754264 has the following functions. (1) Interrupt function • Vectored interrupt function for hardware control, enabling/disabling the interrupt acknowledgement by the interrupt enable flag (IE ×××) and interrupt master enable flag (IME). • Can set any interrupt start address. • Multiple interrupts wherein the order of priority can be specified by the interrupt priority select register (IPS). • Test function of interrupt request flag (IRQ ×××). An interrupt generated can be checked by software. • Release the standby mode. A release interrupt can be selected by the interrupt enable flag. (2) Test function • Test request flag (IRQ2) generation can be checked by software. • Release the standby mode. The test source to be released can be selected by the test enable flag. |
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