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56F803 데이터시트(PDF) 29 Page - Freescale Semiconductor, Inc |
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56F803 데이터시트(HTML) 29 Page - Freescale Semiconductor, Inc |
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29 / 57 page ![]() 56F803 Technical Data, Rev. 16 24 Freescale Semiconductor 5. Defines program cycle 6. Defines erase cycle 7. Defines mass erase cycle, erase whole block 8. Defines non-volatile store cycle Table 3-6 IFREN Truth Table Mode IFREN = 1 IFREN = 0 Read Read information block Read main memory block Word program Program information block Program main memory block Page erase Erase information block Erase main memory block Mass erase Erase both block Erase main memory block Table 3-7 Flash Timing Parameters Operating Conditions: V SS = VSSA = 0 V, VDD = VDDA = 3.0–3.6V, TA = –40° to +85°C, CL ≤ 50pF Characteristic Symbol Min Typ Max Unit Figure Program time Tprog* 20 – – us Figure 3-4 Erase time Terase* 20 – – ms Figure 3-5 Mass erase time Tme* 100 – – ms Figure 3-6 Endurance1 ECYC 10,000 20,000 – cycles Data Retention1 DRET 10 30 – years The following parameters should only be used in the Manual Word Programming Mode PROG/ERASE to NVSTR set up time Tnv* –5 – us Figure 3-4, Figure 3-5, Figure 3-6 NVSTR hold time Tnvh* –5 – us Figure 3-4, Figure 3-5 NVSTR hold time (mass erase) Tnvh1* – 100 – us Figure 3-6 NVSTR to program set up time Tpgs* –10 – us Figure 3-4 Recovery time Trcv* –1 – us Figure 3-4, Figure 3-5, Figure 3-6 |
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