AT83SND2CMP3 datasheet(77/97 Pages) ATMEL

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AT83SND2CMP3

7524B–MP3–05/06

Electrical Characteristics

Absolute Maximum Rating

DC Characteristics

Digital Logic

Storage Temperature ......................................... -65 to +150

°C

Voltage on any other Pin to VSS .................................... -0.3 to +4.0 V

OL per I/O Pin ................................................................. 5 mA

Power Dissipation ............................................................. 1 W

Operating Conditions

Ambient Temperature Under Bias........................ -40 to +85

°C

DD ......................................................................................................... 2.7 to 3.3V

*NOTICE:

Stressing the device beyond the “Absolute Maxi-

mum Ratings” may cause permanent damage.

These are stress ratings only. Operation beyond

the “operating conditions” is not recommended

and extended exposure beyond the “Operating

Conditions” may affect device reliability.

Table 57. Digital DC Characteristics

VDD = 2.7 to 3.3 V, TA = -40 to +85°C

Symbol

Parameter

Min

Typ(1)

Max

Units

Test Conditions

VIL

Input Low Voltage

-0.5

0.2·VDD -0.1

VIH1

(2)

Input High Voltage (except RST, X1)

0.2·VDD +1.1

VDD

VIH2

Input High Voltage (RST, X1)

0.7·VDD

VDD +0.5

VOL1

Output Low Voltage

(except P0, MCMD, MDAT, MCLK,

SCLK, DCLK, DSEL, DOUT)

0.45

IOL= 1.6 mA

VOL2

Output Low Voltage

(P0, MCMD, MDAT, MCLK, SCLK,

DCLK, DSEL, DOUT)

0.45

IOL= 3.2 mA

VOH1

Output High Voltage

(P1, P2, P3, P4 and P5)

VDD -0.7

IOH= -30 μA

VOH2

Output High Voltage

(P0, P2 address mode, MCMD, MDAT,

MCLK, SCLK, DCLK, DSEL, DOUT, D+,

D-)

VDD -0.7

IOH= -3.2 mA

Logical 0 Input Current (P1, P2, P3, P4

and P5)

-50

μAV

IN= 0.45 V

ILI

Input Leakage Current (P0, MCMD,

MDAT, MCLK, SCLK, DCLK, DSEL,

DOUT)

μA

0.45< VIN< VDD

Logical 1 to 0 Transition Current

(P1, P2, P3, P4 and P5)

-650

μAV

IN= 2.0 V

RRST

Pull-Down Resistor

200

CIO

Pin Capacitance

TA= 25°C

VRET

VDD Data Retention Limit

1.8

IDD

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