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MPC8540CPX667JC 데이터시트(PDF) 79 Page - Freescale Semiconductor, Inc |
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MPC8540CPX667JC 데이터시트(HTML) 79 Page - Freescale Semiconductor, Inc |
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79 / 104 page ![]() MPC8540 Integrated Processor Hardware Specifications, Rev. 4 Freescale Semiconductor 79 Thermal 16 Thermal This section describes the thermal specifications of the MPC8540. 16.1 Thermal Characteristics Table 59 provides the package thermal characteristics for the MPC8540. 16.2 Thermal Management Information This section provides thermal management information for the flip chip plastic ball grid array (FC-PBGA) package for air-cooled applications. Proper thermal control design is primarily dependent on the system-level design—the heat sink, airflow, and thermal interface material. The recommended attachment method to the heat sink is illustrated in Figure 44. The heat sink should be attached to the printed-circuit board with the spring force centered over the die. This spring force should not exceed 10 pounds force. Table 59. Package Thermal Characteristics Characteristic Symbol Value Unit Notes Junction-to-ambient Natural Convection on four layer board (2s2p) RθJMA 16 °C/W 1, 2 Junction-to-ambient (@100 ft/min or 0.5 m/s) on four layer board (2s2p) RθJMA 14 °C/W 1, 2 Junction-to-ambient (@200 ft/min or 1 m/s) on four layer board (2s2p) RθJMA 12 •C/W 1, 2 Junction-to-board thermal RθJB 7.5 •C/W 3 Junction-to-case thermal RθJC 0.8 •C/W 4 Notes 1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance 2. Per JEDEC JESD51-6 with the board horizontal. 3. Thermal resistance between the die and the printed-circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. 4. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). Cold plate temperature is used for case temperature; measured value includes the thermal resistance of the interface layer. |
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