| 전자부품 데이터시트 검색엔진 |
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P4C1023-70CWC 데이터시트(PDF) 6 Page - Pyramid Semiconductor Corporation |
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P4C1023-70CWC 데이터시트(HTML) 6 Page - Pyramid Semiconductor Corporation |
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6 / 11 page ![]() P4C1023/P4C1023L Page 6 of 11 Document # SRAM126 REV OR Write Active Read TIMING WAVEFORM OF WRITE CYCLE NO.2 (CE CE CE CE CE CONTROLLED)(6) * including scope and test fixture. Note: Because of the high speed of the P4C1023L, care must be taken when testing this device; an inadequate setup can cause a normal function- ing part to be rejected as faulty. Long high-inductance leads that cause supply bounce must be avoided by bringing the V CC and ground planes directly up to the contactor fingers. A 0.01 µF high frequency capacitor is also required between V CC and ground. To avoid signal reflections, proper termination must be used; for example, a 50 Ω test environment should be terminated into a 50Ω load with 1.77V (Thevenin Voltage) at the comparator input, and a 589 Ω resistor must be used in series with D OUT to match 639Ω (Thevenin Resistance). AC TEST CONDITIONS TRUTH TABLE Input Pulse Levels Input Rise and Fall Times Input Timing Reference Level Output Timing Reference Level Output Load GND to 3.0V 3ns 1.5V 1.5V See Figures 1 and 2 Mode Standby D OUT Disabled Standby Power I/O WE WE WE WE WE OE OE OE OE OE CE CE CE CE CE High Z D OUT D IN X H H L X H L X H L L L Active Active High Z |
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