PM5352 datasheet(61/77 Pages) PMC

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PM5352 S/UNI STAR

DATA SHEET

PMC-1990421

ISSUE 2

SATURN USER NETWORK INTERFACE 155 (STAR)

PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE

TEST FEATURES DESCRIPTION

Simultaneously asserting (low) the CSB, RDB and WRB inputs causes all

digital output pins and the data bus to be held in a high-impedance state.

This test feature may be used for board testing.

Test mode registers are used to apply test vectors during production

testing of the S/UNI-STAR. Test mode registers (as opposed to normal

mode registers) are selected when TRS (A[10]) is high.

Test mode registers may also be used for board testing. When all of the

TSBs within the S/UNI-STAR are placed in test mode 0, device inputs may

be read and device outputs may be forced via the microprocessor

interface (refer to the section "Test Mode 0" for details).

In addition, the S/UNI-STAR also supports a standard IEEE 1149.1 five-

signal JTAG boundary scan test port for use in board testing. All digital

device inputs may be read and all digital device outputs may be forced via

the JTAG test port.

Table 2: Test Mode Register Memory Map

Address

0x000-0x3FF

Normal Mode Registers

0x400

Master Test Register

0x401-0x7FF

Reserved For Test

9.1

Master Test Register

Notes on Test Mode Register Bits:

1. Writing values into unused register bits has no effect. However, to

ensure software compatibility with future, feature-enhanced versions of

the product, unused register bits must be written with logic zero.

Reading back unused bits can produce either a logic one or a logic

zero; hence, unused register bits should be masked off by software

when read.

2. Writable test mode register bits are not initialized upon reset unless

otherwise noted.

PM5352 데이터시트(PDF) 61 Page - PMC-Sierra, Inc