| 전자부품 데이터시트 검색엔진 |
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M58PR512J 데이터시트(PDF) 65 Page - STMicroelectronics |
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M58PR512J 데이터시트(HTML) 65 Page - STMicroelectronics |
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65 / 114 page ![]() M58PR256J, M58PR512J Program and erase times and endurance cycles 65/114 13 Program and erase times and endurance cycles The Program and Erase times and the number of Program/ Erase cycles per Block are shown in Table 22 Exact erase times may change depending on the memory array condition. The best case is when all the bits in the Block are at ‘0’ (pre-programmed). The worst case is when all the bits in the Block are at ‘1’ (not preprogrammed). Usually, the system overhead is negligible with respect to the erase time. In the M58PRxxxJ the maximum number of Program/Erase cycles depends on the VPP voltage supply used. Table 22. Program/Erase times and endurance cycles(1) (2) Parameter Condition Min Typ Typical after 100kW/E Cycles Max Unit Erase EFA Block (4 KWord) 0.4 2.5 s Main Array Block 128 KWord) 0.9 4 s Program(3) Single Cell(4) Word Program(5) 50 230 µs Buffer Program 250 500 µs Single Word(4) Word Program(5) 50 230 µs Buffer Program 250 500 µs Buffer (512 Words) (Buffer Program) 2.15 4.3 ms EFA Block (4 KWord) 0.2 0.94 s Main Array Block (128 KWord) (Buffer Program) 0.55 1.1 s Suspend Latency Program 20 25 µs Erase 20 30 µs Program/Erase Cycles (per Block) Main Array Block 100,000 cycles EFA Block 100,000 Blank Check Main Array Block 3.2 ms |
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