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ABSOLUTE MAXIMUM RATINGS

RECOMMENDED OPERATING CONDITIONS

PCM1774

SLAS551 – JULY 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

over operating free-air temperature range (unless otherwise noted)

(1)

MAX

UNIT

Supply voltage

–0.3 to 4

V

Ground voltage differences: DGND, AGND, PGND

±0.1

V

Input voltage

–0.3 to 4

V

Input current (any pin except supplies)

±10

mA

Ambient temperature under bias

–40 to 110

°C

Storage temperature

–55 to 150

°C

Junction temperature

150

°C

Lead temperature (soldering)

260

°C, 5 s

Package temperature (reflow, peak)

260

°C

(1)

Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating

conditions is not implied. Exposure to absolute–maximum–rated conditions for extended periods may affect device reliability.

over operating free-air temperature range (unless otherwise noted)

MIN

NOM

MAX

UNIT

2.4

3.3

3.6

V

1.71

3.3

3.6

V

Digital input logic family

CMOS

SCKI system clock

3.072

18.432

MHz

Digital input clock frequency

LRCK sampling clock

8

48

kHz

LOL and LOR

10

k

Ω

Analog output load resistance

HPOL and HPOR

16

Ω

Analog output load capacitance

30

pF

Digital output load capacitance

10

pF

Operating free-air temperature

–40

85

°C

2

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