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REF80 데이터시트(PDF) 15 Page - Texas Instruments

부품명 REF80
상세설명  REF80 Temperature-Controlled Buried Zener Reference with 0.05ppm/°C Drift and < 1ppm Stability
PDF  27 Pages
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REF80 데이터시트(HTML) 15 Page - Texas Instruments

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VHYSTppm =  VPRE−VPOST
VPRE ×106
(3)
where-
• VHYST = thermal hysteresis (in units of ppm)
• VPRE = output voltage measured at 25°C pre-temperature cycling
• VPOST = output voltage measured after the device has cycled from 25°C through the specified temperature
range of 0°C to75°C and returns to 25°C.
Thermal Hysteresis (ppm)
0
0.5
1
1.5
2
2.5
3
0
10
20
30
40
50
Figure 8-4. Thermal Hysteresis (Cycle 1)
Distribution (0°C to 70°C)
Thermal Hysteresis (ppm)
0
0.2
0.4
0.6
0.8
1
0
20
40
60
80
Figure 8-5. Thermal Hysteresis (Cycle 2)
Distribution (0°C to 70°C)
8.4 Noise Performance
8.4.1 1/f Noise
1/f noise, also known as flicker noise, is dominant mostly in the lower frequency bands. Flicker noise affects the
device output voltage which can affect the ENOB of the signal chain. REF80 data sheet specifies flicker noise for
0.1Hz to 10Hz frequency band where 1/f noise has maximum power. Flicker noise is measured by filtering the
output from 0.1Hz to 10Hz. Since the 1/f noise is an extremely low value, the frequency of interest needs to be
amplified and band-pass filtered as shown in Figure 8-6. 1/f noise must be tested in a Faraday cage enclosure
to block environmental noise. Refer to application note Techniques for Noise Measurements in Precision Series
References for more detail on noise measurement for precision series references.
www.ti.com
REF80
SNAS856A – SEPTEMBER 2024 – REVISED MARCH 2025
Copyright © 2025 Texas Instruments Incorporated
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Product Folder Links: REF80



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