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TDA7415CB 데이터시트(PDF) 46 Page - STMicroelectronics |
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TDA7415CB 데이터시트(HTML) 46 Page - STMicroelectronics |
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46 / 50 page ![]() Programming TDA7415CB 46/50 Successfully entering the test-mode requires to set bit D6 of the sub address (test mode-bit) to "1". In test-mode, the TUNER L&R inputs are reconfigured as output for the selected test signals Note: This byte is used for testing and/or evaluation purposes only and must not be set to other values than the default "11111110" in the application. Table 31. Testing * (addr. 31) MSB LSB FUNCTION D7 D6 D5 D4 D3 D2 D1 D0 0 1 Device clock Enable internal clock generation Allow external clocking in fast-mode 11 1 Unused, do not alter Test selector 0 0 0 0 1 1 1 1 0 0 1 1 0 0 1 1 0 1 0 1 0 1 0 1 TUNER L out: DCDet., lower TC-Vth Spec.Anal. 60Hz-bandpass Spec.Anal. 160Hz-bandpass Spec.Anal. 400Hz-bandpass Spec.Anal. 1kHz-bandpass Spec.Anal. 2,5kHz-bandpass Spec.Anal. 6,3kHz-bandpass Spec.Anal. 16kHz-bandpass TUNER R out: DCDet., upper TC-Vth 5,5V CMOS-supply DCDet., time constant 200kHz reference clock actual Soft-Mute clock actual Soft-Step clock SC-reference, left chan. DC-Offset monitor point 0 1 Test mode Enabled * Disabled |
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