| 전자부품 데이터시트 검색엔진 |
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LM5116-HT 데이터시트(PDF) 7 Page - Texas Instruments |
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LM5116-HT 데이터시트(HTML) 7 Page - Texas Instruments |
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7 / 36 page ![]() 100.00 1000.00 10000.00 100000.00 1000000.00 120 130 140 150 160 170 180 Continuous T J (°C) LM5116-HT www.ti.com SLVSBS8B – OCTOBER 2013 – REVISED JANUARY 2014 Electrical Characteristics (continued) Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature range of -55°C to +175°C and are provided for reference only. Unless otherwise specified, the following conditions apply: VIN = 48V, VCC = 7.4 V, VCCX = 0 V, EN = 5 V, RT = 16 kΩ, no load on LO and HO. Symbol Parameter Conditions Min Typ Max Units HO Gate Driver VOLH HO Low-state Output Voltage IHO = 100 mA 0.17 0.8 V VOHH HO High-state Output Voltage IHO = -100 mA, 0.45 V VOHH = VHB – VHO HO Rise Time C-load = 1000 pF 19 ns HO High-side Fall Time C-load = 1000 pF 13 ns IOHH Peak HO Source Current VHO = 0 V 1 A IOLH Peak HO Sink Current VHO = VCC 2.2 A HB to SW under-voltage 3 V Switching Characteristics LO Fall to HO Rise Delay C-load = 0 75 ns HO Fall to LO Rise Delay C-load = 0 70 ns xxx (1) See datasheet for absolute maximum and minimum recommended operating conditions. (2) Silicon operating life design goal is 10 years at 105°C junction temperature (does not include package interconnect life). (3) The predicted operating lifetime vs. junction temperature is based on reliability modeling using electromigration as the dominant failure mechanism affecting device wearout for the specific device process and design characteristics. (4) This device is qualified for 1000 hours of continuous operation at maximum rated temperature. Figure 1. LM5116-HT Operating Life Derating Chart Copyright © 2013–2014, Texas Instruments Incorporated Submit Documentation Feedback 7 Product Folder Links: LM5116-HT |
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